Articles | Volume 10
https://doi.org/10.5194/ars-10-215-2012
https://doi.org/10.5194/ars-10-215-2012
18 Sep 2012
 | 18 Sep 2012

Comparison of in-situ delay monitors for use in Adaptive Voltage Scaling

N. Pour Aryan, L. Heiß, D. Schmitt-Landsiedel, G. Georgakos, and M. Wirnshofer

Abstract. In Adaptive Voltage Scaling (AVS) the supply voltage of digital circuits is tuned according to the circuit's actual operating condition, which enables dynamic compensation to PVTA variations. By exploiting the excessive safety margins added in state-of-the-art worst-case designs considerable power saving is achieved. In our approach, the operating condition of the circuit is monitored by in-situ delay monitors. This paper presents different designs to implement the in-situ delay monitors capable of detecting late but still non-erroneous transitions, called Pre-Errors. The developed Pre-Error monitors are integrated in a 16 bit multiplier test circuit and the resulting Pre-Error AVS system is modeled by a Markov chain in order to determine the power saving potential of each Pre-Error detection approach.