Volume 6, 2008 | D.3 Scaling of MOSFET and integrated HF-circuits

Volume 6, 2008 | D.3 Scaling of MOSFET and integrated HF-circuits

26 May 2008
Simultaneous large-scale reliability analysis of ultra-thin MOS gate dielectrics using an automated test system
A. Domdey, K. M. Hafkemeyer, W. H. Krautschneider, and D. Schroeder
Adv. Radio Sci., 6, 205–207, https://doi.org/10.5194/ars-6-205-2008,https://doi.org/10.5194/ars-6-205-2008, 2008
26 May 2008
Investigation of carbon nanotube antennas using thin wire integral equations
N. Fichtner, X. Zhou, and P. Russer
Adv. Radio Sci., 6, 209–211, https://doi.org/10.5194/ars-6-209-2008,https://doi.org/10.5194/ars-6-209-2008, 2008
26 May 2008
A low-noise current preamplifier in 120 nm CMOS technology
H. Uhrmann, W. Gaberl, and H. Zimmermann
Adv. Radio Sci., 6, 213–217, https://doi.org/10.5194/ars-6-213-2008,https://doi.org/10.5194/ars-6-213-2008, 2008
26 May 2008
Highly efficient integrated rectifier and voltage boosting circuits for energy harvesting applications
D. Maurath, C. Peters, T. Hehn, M. Ortmanns, and Y. Manoli
Adv. Radio Sci., 6, 219–225, https://doi.org/10.5194/ars-6-219-2008,https://doi.org/10.5194/ars-6-219-2008, 2008
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