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<front>
<journal-meta>
<journal-id journal-id-type="publisher">ARS</journal-id>
<journal-title-group>
<journal-title>Advances in Radio Science</journal-title>
<abbrev-journal-title abbrev-type="publisher">ARS</abbrev-journal-title>
<abbrev-journal-title abbrev-type="nlm-ta">Adv. Radio Sci.</abbrev-journal-title>
</journal-title-group>
<issn pub-type="epub">1684-9973</issn>
<publisher><publisher-name>Copernicus Publications</publisher-name>
<publisher-loc>Göttingen, Germany</publisher-loc>
</publisher>
</journal-meta>
<article-meta>
<article-id pub-id-type="doi">10.5194/ars-7-123-2009</article-id>
<title-group>
<article-title>Efficient modelling of IC conducted emission for power integrity analysis</article-title>
</title-group>
<contrib-group><contrib contrib-type="author" xlink:type="simple"><name name-style="western"><surname>Kazemzadeh</surname>
<given-names>R.</given-names>
</name>
<xref ref-type="aff" rid="aff2">
<sup>2</sup>
</xref>
<xref ref-type="aff" rid="aff1">
<sup>1</sup>
</xref>
</contrib>
<contrib contrib-type="author" xlink:type="simple"><name name-style="western"><surname>Ludwig</surname>
<given-names>S.</given-names>
</name>
<xref ref-type="aff" rid="aff1">
<sup>1</sup>
</xref>
<xref ref-type="aff" rid="aff2">
<sup>2</sup>
</xref>
</contrib>
<contrib contrib-type="author" xlink:type="simple"><name name-style="western"><surname>Radić-Weissenfeld</surname>
<given-names>Lj.</given-names>
</name>
<xref ref-type="aff" rid="aff2">
<sup>2</sup>
</xref>
<xref ref-type="aff" rid="aff1">
<sup>1</sup>
</xref>
</contrib>
<contrib contrib-type="author" xlink:type="simple"><name name-style="western"><surname>Mathis</surname>
<given-names>W.</given-names>
</name>
<xref ref-type="aff" rid="aff1">
<sup>1</sup>
</xref>
</contrib>
</contrib-group><aff id="aff1">
<label>1</label>
<addr-line>Leibniz University of Hannover Institute of Electromagnetic Theory, Hannover, Germany</addr-line>
</aff>
<aff id="aff2">
<label>2</label>
<addr-line>Fraunhofer Research Institution for Electronic Nano Systems, Advanced System Engineering, Paderborn, Germany</addr-line>
</aff>
<pub-date pub-type="epub">
<day>18</day>
<month>05</month>
<year>2009</year>
</pub-date>
<volume>7</volume>
<fpage>123</fpage>
<lpage>126</lpage>
<permissions>
<copyright-statement>Copyright: &#x000a9; 2009 R. Kazemzadeh et al.</copyright-statement>
<copyright-year>2009</copyright-year>
<license license-type="open-access">
<license-p>This work is licensed under the Creative Commons Attribution 3.0 Unported License. To view a copy of this licence, visit <ext-link ext-link-type="uri"  xlink:href="https://creativecommons.org/licenses/by/3.0/">https://creativecommons.org/licenses/by/3.0/</ext-link></license-p>
</license>
</permissions>
<self-uri xlink:href="https://ars.copernicus.org/articles/7/123/2009/ars-7-123-2009.html">This article is available from https://ars.copernicus.org/articles/7/123/2009/ars-7-123-2009.html</self-uri>
<self-uri xlink:href="https://ars.copernicus.org/articles/7/123/2009/ars-7-123-2009.pdf">The full text article is available as a PDF file from https://ars.copernicus.org/articles/7/123/2009/ars-7-123-2009.pdf</self-uri>
<abstract>
<p>In this paper two methodologies to reduce the complexity
of IC conducted emission models for Power Integrity analysis in ICs are
presented. The methodologies differ concerning the applicability in
simulation tools, complexity and accuracy of the generated models. The first
methodology uses a complex model and reduces its order to generate a model
with a fewer number of elements. This methodology therefore involves a model
order reduction approach. A second minimum complexity, module based
modelling approach is introduced for rough estimations, as the order reduced
model is still too complex for some applications. The two methodologies are
applied to an IC conducted emission model of two digital modules of a 32 Bit
microcontroller. The results of the three models are compared and discussed.
Fields of application for the introduced modelling approaches are the
estimation of the magnitude and time behaviour of the supply current as well
as the determination of the number and position of the IC&apos;s supply pins.</p>
</abstract>
<counts><page-count count="4"/></counts>
</article-meta>
</front>
<body/>
<back>
<ref-list>
<title>References</title>
<ref id="ref1">
<label>1</label><mixed-citation publication-type="other" xlink:type="simple"> Dhia, S. B., Ramdani, M., and Sicard, E.: Electromagnetic Compatibility in Intergrated Circuits, Springer-Verlag, New York, 2006. </mixed-citation>
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<ref id="ref2">
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<label>3</label><mixed-citation publication-type="other" xlink:type="simple"> Hesidenz, D. and Steinecke, T.: Chip-Package EMI Modeling and Simulation Tool &quot;EXPO&quot;, presented at the 2005 EMC Compo, Munich, Germany, 2005. </mixed-citation>
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<label>4</label><mixed-citation publication-type="other" xlink:type="simple"> Landman, P. E.: Low Power Architectural Design, PhD dissertation, Electrical Engineering and Computer Sciences, University of California, Berkeley, CA, 1994. </mixed-citation>
</ref>
<ref id="ref5">
<label>5</label><mixed-citation publication-type="other" xlink:type="simple"> Ludwig, S., Radi&amp;#x0107;-Weissenfeld, Lj., Mathis, W., and John, W.: Efficient Model Reduction of Passive Electrical Networks with a Large Number of Independent Sources, presented at the International Symposium on Circuits and Systems (ISCAS), Seattle, Washington, USA, 2008. </mixed-citation>
</ref>
<ref id="ref6">
<label>6</label><mixed-citation publication-type="other" xlink:type="simple"> Ludwig, S., Radi&amp;#x0107;-Weissenfeld, Lj., Mathis, W., and John, W.: Efficient passive network description of IC conducted emission models for model reduction, Adv. Radio Sci., 6, 133–137, 2008. </mixed-citation>
</ref>
<ref id="ref7">
<label>7</label><mixed-citation publication-type="other" xlink:type="simple"> Radi&amp;#x0107;-Weissenfeld, Lj., Ludwig, S., Mathis, W., and John, W.: Two-step Order Reduction of IC Conducted Emission Models, presented at the 2008 Asia-Pacific EMC Week, Singapore, to be published, 2009. </mixed-citation>
</ref>
</ref-list>
</back>
</article>