8 citations as recorded by crossref.

1. Uncertainty of VNA S-Parameter Measurement Due to Nonideal TRL Calibration Items U. Stumper https://doi.org/10.1109/TIM.2005.843521
2. mm-Wave Through-Load Element for On-Wafer Measurement Applications M. Margalef-Rovira et al. https://doi.org/10.1109/TCSI.2021.3072097
3. Uncertainties of VNA S-Parameter Measurements Applying the TAN Self-Calibration Method U. Stumper https://doi.org/10.1109/TIM.2007.891051
4. Complex S-parameter measurement and its uncertainty evaluation on a vector network analyzer K. Patel et al. https://doi.org/10.1016/j.measurement.2008.04.010
5. Influence of Nonideal Calibration Items on S-Parameter Uncertainties Applying the SOLR Calibration Method U. Stumper https://doi.org/10.1109/TIM.2008.2006962
6. A simple evaluation procedure of the TAN calibration and the influence of non-ideal calibration elements on VNA S-parameter measurements U. Stumper https://doi.org/10.5194/ars-5-5-2007
7. Influence of Different Configurations of Nonideal Calibration Standards on Vector Network Analyzer Performance U. Stumper & T. Schrader https://doi.org/10.1109/TIM.2012.2182889
8. Uncertainties of Multiport VNA S-Parameter Measurements Applying the GSOLT Calibration Method W. Zhao et al. https://doi.org/10.1109/TIM.2012.2210332