|
05 May 2003
A new BIST scheme for low-power and high-resolution DAC testing
H. Li, J. Eckmueller, S. Sattler, H. Eichfeld, and R. Weigel
Viewed
Total article views: 1,750 (including HTML, PDF, and XML)
| HTML |
PDF |
XML |
Total |
BibTeX |
EndNote |
| 809 |
815 |
126 |
1,750 |
144 |
187 |
- HTML: 809
- PDF: 815
- XML: 126
- Total: 1,750
- BibTeX: 144
- EndNote: 187
Views and downloads (calculated since 01 Feb 2013)
Cumulative views and downloads
(calculated since 01 Feb 2013)
Latest update: 29 Apr 2026
