Articles | Volume 1
https://doi.org/10.5194/ars-1-289-2003
https://doi.org/10.5194/ars-1-289-2003
05 May 2003
 | 05 May 2003

A new BIST scheme for low-power and high-resolution DAC testing

H. Li, J. Eckmueller, S. Sattler, H. Eichfeld, and R. Weigel

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