|
05 May 2003
A new BIST scheme for low-power and high-resolution DAC testing
H. Li, J. Eckmueller, S. Sattler, H. Eichfeld, and R. Weigel
Viewed
Total article views: 1,460 (including HTML, PDF, and XML)
| HTML |
PDF |
XML |
Total |
BibTeX |
EndNote |
| 642 |
713 |
105 |
1,460 |
112 |
98 |
- HTML: 642
- PDF: 713
- XML: 105
- Total: 1,460
- BibTeX: 112
- EndNote: 98
Views and downloads (calculated since 01 Feb 2013)
Cumulative views and downloads
(calculated since 01 Feb 2013)
Latest update: 21 Nov 2024
