|
05 May 2003
A new BIST scheme for low-power and high-resolution DAC testing
H. Li, J. Eckmueller, S. Sattler, H. Eichfeld, and R. Weigel
Viewed
Total article views: 1,655 (including HTML, PDF, and XML)
| HTML |
PDF |
XML |
Total |
BibTeX |
EndNote |
| 760 |
775 |
120 |
1,655 |
130 |
169 |
- HTML: 760
- PDF: 775
- XML: 120
- Total: 1,655
- BibTeX: 130
- EndNote: 169
Views and downloads (calculated since 01 Feb 2013)
Cumulative views and downloads
(calculated since 01 Feb 2013)
Latest update: 03 Dec 2025
