Articles | Volume 3
https://doi.org/10.5194/ars-3-167-2005
https://doi.org/10.5194/ars-3-167-2005
12 May 2005
 | 12 May 2005

Recent Applications and Advances of Numerical Modeling and Wavefield Inversion in Nondestructive Testing

R. Marklein, K. J. Langenberg, K. Mayer, J. Miao, A. Shlivinski, A. Zimmer, W. Müller, V. Schmitz, C. Kohl, and U. Mletzko

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