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12 May 2005
Recent Applications and Advances of Numerical Modeling and Wavefield Inversion in Nondestructive Testing
R. Marklein, K. J. Langenberg, K. Mayer, J. Miao, A. Shlivinski, A. Zimmer, W. Müller, V. Schmitz, C. Kohl, and U. Mletzko
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