Articles | Volume 3
https://doi.org/10.5194/ars-3-355-2005
https://doi.org/10.5194/ars-3-355-2005
13 May 2005
 | 13 May 2005

A new circuit technique for reduced leakage current in Deep Submicron CMOS technologies

A. Schmitz and R. Tielert

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