Articles | Volume 4
https://doi.org/10.5194/ars-4-281-2006
https://doi.org/10.5194/ars-4-281-2006
06 Sep 2006
 | 06 Sep 2006

Modelling of the parametric yield in decananometer SRAM-Arrays

Th. Fischer, T. Nirschl, B. Lemaitre, and D. Schmitt-Landsiedel

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