Articles | Volume 5
https://doi.org/10.5194/ars-5-439-2007
https://doi.org/10.5194/ars-5-439-2007
13 Jun 2007
 | 13 Jun 2007

Methods for the calibrated measurement of the scattering parameters of planar multi-port devices

I. Rolfes and B. Schiek

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