Articles | Volume 7
https://doi.org/10.5194/ars-7-155-2009
https://doi.org/10.5194/ars-7-155-2009
18 May 2009
 | 18 May 2009

Charakterisierung von CMOS RF Blöcken mittels Volterra-Reihen zur Optimierung des Designprozesses

B. Fei, A. H. Darrat, and W. Mathis

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