Articles | Volume 9
https://doi.org/10.5194/ars-9-9-2011
https://doi.org/10.5194/ars-9-9-2011
29 Jul 2011
 | 29 Jul 2011

Verification of scattering parameter measurements in waveguides up to 325 GHz including highly-reflective devices

T. Schrader, K. Kuhlmann, R. Dickhoff, J. Dittmer, and M. Hiebel

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