Articles | Volume 1
https://doi.org/10.5194/ars-1-273-2003
https://doi.org/10.5194/ars-1-273-2003
05 May 2003
 | 05 May 2003

Analytische Modellierung des Zeitverhaltens und der Verlustleistung von CMOS-Gattern

R. Geißler and H.-J. Pfleiderer

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