Articles | Volume 17
https://doi.org/10.5194/ars-17-51-2019
https://doi.org/10.5194/ars-17-51-2019
19 Sep 2019
 | 19 Sep 2019

High-Frequency Modeling of Coplanar Waveguides Including Surface Roughness

Gerald Gold, Konstantin Lomakin, Klaus Helmreich, and Uwe Arz

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Latest update: 19 Apr 2024
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Short summary
An existing analytical transmission line model to describe propagation properties of coplanar waveguides including parasitic effects was extended to take into account surface roughness of conductor traces. The influence of those parasitics is successively included in the simulation and compared to measurements. The device under test (DUT) was fabricated on an ceramic wafer. Propagation characteristics were measured up to 120 GHz.