Articles | Volume 17
19 Sep 2019
 | 19 Sep 2019

High-Frequency Modeling of Coplanar Waveguides Including Surface Roughness

Gerald Gold, Konstantin Lomakin, Klaus Helmreich, and Uwe Arz

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Cited articles

Abbott, E. and Firestone, F.: Specifying surface quality: a method based on accurate measurement and comparison, Mech. Eng., 55, 569–572, 1933. a
Arz, U., Zinal, S., Probst, T., Hechtfischer, G., Schmückle, F. J., and Heinrich, W.: Establishing traceability for on-wafer S-parameter measurements of membrane technology devices up to 110 GHz, in: 2017 90th ARFTG Microwave Measurement Symposium (ARFTG), Boulder, CO, 1–4,, 2017. a
Gold, G. and Helmreich, K.: A Physical Model for Skin Effect in Rough Surfaces, in: 2012 7th European Microwave Integrated Circuit Conference, Amsterdam, 631–634, 2012. a, b
Gold, G. and Helmreich, K.: A Physical Surface Roughness Model and Its Applications, IEEE T. Microw. Theory, 65, 3720–3732,, 2017. a
Heinrich, W.: Quasi-TEM description of MMIC coplanar lines including conductor-loss effects, IEEE T. Microw. Theory, 41, 45–52,, 1993. a, b, c, d, e
Short summary
An existing analytical transmission line model to describe propagation properties of coplanar waveguides including parasitic effects was extended to take into account surface roughness of conductor traces. The influence of those parasitics is successively included in the simulation and compared to measurements. The device under test (DUT) was fabricated on an ceramic wafer. Propagation characteristics were measured up to 120 GHz.