Articles | Volume 18
https://doi.org/10.5194/ars-18-43-2020
https://doi.org/10.5194/ars-18-43-2020
10 Dec 2020
 | 10 Dec 2020

Scattering and diffraction of a uniform complex-source beam by a slit in a perfectly conducting plane screen

Ludger Klinkenbusch

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Latest update: 16 Sep 2025
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Short summary
A new analytical method has been introduced to exactly solve the classical problem of electromagnetic diffraction by a slit. It is faster and easier to implement than the standard solution using Mathieu functions. Moreover, the paper contains a successful comparison of the scattered fields for an incident plane wave with that one obtained for an incident Gaussian beam which is easily modelled by a complex-source beam.
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