16 citations as recorded by crossref.

1. Performance and non-destructive evaluation methods of airborne radome and stealth structures R. Panwar & J. Lee 10.1088/1361-6501/aaa8aa
2. Investigation of Electromagnetic Behavior of MACOR for View Dump Application P. Tripathi et al. 10.1109/TPS.2024.3524488
3. Artificial intelligence solution to extract the dielectric properties of materials at sub‐THz frequencies M. Güneşer 10.1049/iet-smt.2018.5356
4. Recent advances in electromagnetic interference shielding properties of metal and carbon filler reinforced flexible polymer composites: A review S. Sankaran et al. 10.1016/j.compositesa.2018.08.006
5. Dielectric properties of coal in the terahertz frequency region of 100–500 GHz W. Fan et al. 10.1016/j.fuel.2016.10.046
6. Design and Calibration of a Compact Quasi-Optical System for Material Characterization in Millimeter/Submillimeter Wave Domain A. Kazemipour et al. 10.1109/TIM.2014.2376115
7. Photoacoustic Substitution Method for Calibrating Subterahertz Attenuation in Free Space H. Iida & M. Kinoshita 10.1109/TIM.2021.3060577
8. Calibration of the Three-Port VNA using the General 6-Term Error Model W. Zhao et al. 10.1163/156939310790735778
9. Low‐Temperature Sintering of Low‐Loss Millimeter‐Wave Dielectric Ceramics Based on Li‐Kosmochlor, LiCrSi2O6 F. Kamutzki et al. 10.1002/pssa.202200685
10. Millimeter-wave free-space dielectric characterization X. Liu et al. 10.1016/j.measurement.2021.109472
11. 3-D Printed Plug and Play Prototyping for Low-Cost Sub-THz Subsystems S. Shin et al. 10.1109/ACCESS.2022.3167437
12. A Partially Filled Shorted Coaxial Line Technique for Material Relative Permittivity Determination F. Mbango et al. 10.1080/03772063.2021.1902866
13. The Characterization of Microwave Properties of PU-AgNWs Films W. Sun et al. 10.1080/00150193.2012.740303
14. A Novel Reformulation of LNN Calibration Algorithm W. Zhao 10.1109/TIM.2023.3329157
15. Towards additive manufacturing of dielectric accelerating structures M. Kellermeier et al. 10.1088/1742-6596/1596/1/012020
16. Improved Method for Permittivity Determination of Dielectric Samples by Free-Space Measurements U. Hasar et al. 10.1109/TIM.2022.3153991