Susceptibility and hardening of electronic systems to fast transient threats: new challenges ahead

Abstract. The field of susceptibility and hardening of electronic systems to transient threats has experienced a significant growth during the past ten years. Driven by the development in the area of non-lethal electromagnetic weapons it has become necessary to extend the classical set of transient threats, consisting of LEMP, ESD and NEMP, by a fast transient threat with an extreme bandwidth. The investigation of the susceptibility to those UWB threats, characterized by a bandwidth of more than a quarter of the center frequency, rise times of less than 200 ps and pulse durations in the ns regime, is of special interest. This paper presents an overview of current challenges of the hardening against UWB threats. It discusses recent research trends in transient susceptibility measurements, protection concepts and methods of analysis.