Articles | Volume 20
https://doi.org/10.5194/ars-20-119-2023
https://doi.org/10.5194/ars-20-119-2023
27 Apr 2023
 | 27 Apr 2023

Modeling and Analytical Description of Parasitic Probe Effects in Measurements of Conductor-Backed Coplanar Waveguides

Gia Ngoc Phung and Uwe Arz

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Short summary
This paper demonstrates how probe effects deteriorate mTRL-calibrated S-parameter measurements of conductor-backed CPW structures. A thorough study of CB-CPWs through field analysis is presented and for the first time an analytical description to predict the occurrence of ripples and resonance effects taking the probe geometries into account is presented. The analytical description is verified by em simulation and measurement for two different substrate materials, i.e. fused silica and alumina.