Articles | Volume 20
https://doi.org/10.5194/ars-20-119-2023
https://doi.org/10.5194/ars-20-119-2023
27 Apr 2023
 | 27 Apr 2023

Modeling and Analytical Description of Parasitic Probe Effects in Measurements of Conductor-Backed Coplanar Waveguides

Gia Ngoc Phung and Uwe Arz

Viewed

Total article views: 922 (including HTML, PDF, and XML)
HTML PDF XML Total BibTeX EndNote
804 93 25 922 22 23
  • HTML: 804
  • PDF: 93
  • XML: 25
  • Total: 922
  • BibTeX: 22
  • EndNote: 23
Views and downloads (calculated since 27 Apr 2023)
Cumulative views and downloads (calculated since 27 Apr 2023)

Viewed (geographical distribution)

Total article views: 926 (including HTML, PDF, and XML) Thereof 926 with geography defined and 0 with unknown origin.
Country # Views %
  • 1
1
 
 
 
 
Latest update: 16 Nov 2024
Download
Short summary
This paper demonstrates how probe effects deteriorate mTRL-calibrated S-parameter measurements of conductor-backed CPW structures. A thorough study of CB-CPWs through field analysis is presented and for the first time an analytical description to predict the occurrence of ripples and resonance effects taking the probe geometries into account is presented. The analytical description is verified by em simulation and measurement for two different substrate materials, i.e. fused silica and alumina.