Godshalk, E. M.: Surface Wave Phenomenon in Wafer Probing Environments, in: 40th ARFTG Conference Digest, 3–4 December 1992, Orlando, FL, USA, IEEE, vol. 22, 10–19,
https://doi.org/10.1109/ARFTG.1992.326994, 1992.
a
Hammerstad, E. O.: Equations for Microstrip Circuit Design, in: 1975 5th European Microwave Conference, 1–4 September 1975, Hamburg, Germany, IEEE, 268–272,
https://doi.org/10.1109/EUMA.1975.332206, 1975.
a,
b,
c
Lee, G.-A. and Lee, H.-Y.: Suppression of the CPW Leakage in Common Millimeter-Wave Flip-Chip Structures, IEEE Microw. Guided W., 8, 366–368,
https://doi.org/10.1109/75.736245, 1998.
a
Liu, Y. and Itoh, T.: Leakage Phenomena in Multilayered Conductor-Backed Coplanar Waveguides, IEEE Microw. Guided W., 3, 426–427,
https://doi.org/10.1109/75.248521, 1993.
a
Marks, R. B.: A Multiline Method of Network Analyzer Calibration, IEEE T. Microw. Theory, 39, 1205–1215, 1991. a
McKinzie, W. E. and Alexopoulos, N. G.: Leakage Losses for the Dominant
Mode of Conductor-Backed Coplanar Waveguide, IEEE Microw. Guided W., 2, 65–66,
https://doi.org/10.1109/75.122412, 1992.
a
Phung, G. N. and Arz, U.: Anomalies in Multiline-TRL-Corrected Measurements of Short CPW Lines, in: 96th ARFTG Microwave Measurement Symposium (ARFTG), 18–22 January 2021, San Diego, CA, USA, IEEE, 1–4,
https://doi.org/10.1109/ARFTG49670.2021.9425345, 2021a.
a,
b
Phung, G. N. and Arz, U.: Parasitic Probe Effects in Measurements of Conductor-Backed Coplanar Waveguides, in: 2021 Kleinheubach Conference, 28–30 September 2021, Miltengerg, Germany, IEEE, 1–4,
https://doi.org/10.23919/IEEECONF54431.2021.9598396, 2021b.
a
Phung, G. N., Schmückle, F. J., Doerner, R., Heinrich, W., Probst, T., and Arz, U.: Impact of Substrate Modes on mTRL-Calibrated CPW Measurements in G Band, in: 2018 48th European Microwave Conference (EuMC), 23–27 September 2018, Madrid, Spain, IEEE, 194–197,
https://doi.org/10.23919/EuMC.2018.8541813, 2018a.
a
Phung, G. N., Schmückle, F. J., Doerner, R., Heinrich, W., Probst, T., and Arz, U.: Effects Degrading Accuracy of CPW mTRL Calibration at W Band, in: 2018 IEEE/MTT-S International Microwave Symposium – IMS, 10–15 June 2018, Philadelphia, PA, USA, IEEE, 1296–1299,
https://doi.org/10.1109/MWSYM.2018.8439837, 2018b.
a,
b
Phung, G. N., Schmückle, F. J., Doerner, R., Kähne, B., Fritzsch, T., Arz, U., and Heinrich, W.: Influence of Microwave Probes on Calibrated On-Wafer Measurements, IEEE T. Microw. Theory, 67, 1892–1900,
https://doi.org/10.1109/TMTT.2019.2903400, 2019.
a,
b
Phung, G. N., Arz, U., Kuhlmann, K., Doerner, R., and Heinrich, W.: Improved Modeling of Radiation Effects in Coplanar Waveguides with Finite Ground Width, in: 2020 50th European Microwave Conference (EuMC), 12–14 January 2021, Utrecht, the Netherlands, IEEE, 404–407,
https://doi.org/10.23919/EuMC48046.2021.9338133, 2021.
a
Probst, T., Doerner, R., Ohlrogge, M., Lozar, R., and Arz, U.: 110 GHz On-Wafer Measurement Comparison on Alumina Substrate, in: 2017 90th ARFTG Microwave Measurement Symposium (ARFTG), 28 November–1 December 2017, Boulder, CO, USA, IEEE, 1–4,
https://doi.org/10.1109/ARFTG.2017.8255867, 2017.
a
Shigesawa, H., Tsuji, M., and Oliner, A. A.: A New Mode-Coupling Effect on Coplanar Waveguides of Finite Width, in: IEEE International Digest on Microwave Symposium, 8–10 May 1990, Dallas, TX, USA, IEEE, vol. 3, 1063–1066,
https://doi.org/10.1109/MWSYM.1990.99763, 1990.
a
Spirito, M., Arz, U., Phung, G. N., Schmückle, F. J., Heinrich, W., and Lozar, R.: Guidelines for the Design of Calibration Substrates, including the Suppression of Parasitic Modes for Frequencies up to and including 325 GHz, EMPIR 14IND02 – PlanarCal, 2018, Physikalisch-Technische Bundesanstalt (PTB),
https://doi.org/10.7795/530.20190424A, 2018a.
a,
b
Spirito, M., De Martino, C., and Galatro, L.: On the Impact of Radiation Losses in TRL Calibrations, in: 2018 91st ARFTG Microwave Measurement Conference (ARFTG), 15 June 2018, Philadelphia, PA, USA, IEEE, 1–3,
https://doi.org/10.1109/ARFTG.2018.8423820, 2018b.
a
Tsuji, M., Shigesawa, H., and Oliner, A. A.: New Surface-Wave-Like Mode on CPWs of Infinite Width and its Role in Explaining the Leakage Cancellation Effect, in: 1992 IEEE MTT-S Microwave Symposium Digest, 1–5 June 1992, Albuquerque, NM, USA, IEEE, vol. 1, 495–498,
https://doi.org/10.1109/MWSYM.1992.188022, 1992.
a
Yadav, C., Deng, M., Fregonese, S., Cabbia, M., De Matos, M., Plano, B., and Zimmer, T.: Importance and Requirement of Frequency Band Specific RF Probes EM Models in Sub-THz and THz Measurements up to 500 GHz,
IEEE T. Thz. Sci. Techn., 10, 558–563, 2020. a