9 citations as recorded by crossref.

1. Origin of the Half-Wavelength Errors in Microwave Measurements Using Through–Line Calibrations P. Buff et al.
2. A Wide-Band Test Fixture for Analyzing Parasitic Effects of RF Passive SMD Components X. Cao & Z. Tang
3. Uncertainties of VNA S-Parameter Measurements Applying the TAN Self-Calibration Method U. Stumper
4. Complex S-parameter measurement and its uncertainty evaluation on a vector network analyzer K. Patel et al.
5. A simple evaluation procedure of the TAN calibration and the influence of non-ideal calibration elements on VNA S-parameter measurements U. Stumper
6. A Reformulation and Sensitivity Analysis of TRL W. Zhao & Y. Wang
7. Traceable Uncertainty Propagation and Analysis in S-Parameter Measurement Due to Nonideal Calibration Standards and Noise H. Li et al.
8. Pin-Gap Correction of Coaxial Calibration Standards for TRL or LRL Calibration H. Koo et al.
9. Calibration Method for Vector Network Analyzers Using One or Two Known Reflection Standards U. Stumper & T. Schrader