10 citations as recorded by crossref.

1. Origin of the Half-Wavelength Errors in Microwave Measurements Using Through–Line Calibrations P. Buff et al. https://doi.org/10.1109/TIM.2007.904490
2. A Wide-Band Test Fixture for Analyzing Parasitic Effects of RF Passive SMD Components X. Cao & Z. Tang https://doi.org/10.1155/2017/7852135
3. A simple evaluation procedure of the TAN calibration and the influence of non-ideal calibration elements on VNA S-parameter measurements U. Stumper https://doi.org/10.5194/ars-5-5-2007
4. Pin-Gap Correction of Coaxial Calibration Standards for TRL or LRL Calibration H. Koo et al. https://doi.org/10.1109/ACCESS.2022.3162248
5. Uncertainties of VNA S-Parameter Measurements Applying the TAN Self-Calibration Method U. Stumper https://doi.org/10.1109/TIM.2007.891051
6. Complex S-parameter measurement and its uncertainty evaluation on a vector network analyzer K. Patel et al. https://doi.org/10.1016/j.measurement.2008.04.010
7. A Reformulation and Sensitivity Analysis of TRL W. Zhao & Y. Wang https://doi.org/10.1109/TIM.2019.2950825
8. Traceable Uncertainty Propagation and Analysis in S-Parameter Measurement Due to Nonideal Calibration Standards and Noise H. Li et al. https://doi.org/10.1109/TMTT.2026.3661040
9. The Fast Full-Analytical Evaluation Method for Scattering Parameter Uncertainty Based on Multiple Hybrid-Cross Propagation Model H. Li et al. https://doi.org/10.1109/TIM.2026.3697058
10. Calibration Method for Vector Network Analyzers Using One or Two Known Reflection Standards U. Stumper & T. Schrader https://doi.org/10.1109/TIM.2013.2292754