Influence of nonideal LRL or TRL calibration elements on VNA S-parameter measurements

Abstract. For the 7-term LRL and TRL calibration of a four-sampler vector network analyser (VNA), expressions for the deviations of the measured S-parameters of two-port test objects from their actual values are presented as functions of the deviations of the S-parameters of the LRL/TRL calibration elements from their ideal values. The obtained sensitivity coefficients are suitable for establishing the Type-B uncertainty budget for S-parameter measurements. They show how the measurements are affected by imperfect calibration elements and nonideal connections.