Articles | Volume 6
https://doi.org/10.5194/ars-6-1-2008
https://doi.org/10.5194/ars-6-1-2008
26 May 2008
 | 26 May 2008

Time domain reflectrometry measurements using a movable obstacle for the determination of dielectric profiles

B. Will, M. Gerding, S. Schultz, and B. Schiek

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