|
26 May 2008
Simultaneous large-scale reliability analysis of ultra-thin MOS gate dielectrics using an automated test system
A. Domdey, K. M. Hafkemeyer, W. H. Krautschneider, and D. Schroeder
Viewed
Total article views: 1,468 (including HTML, PDF, and XML)
| HTML |
PDF |
XML |
Total |
BibTeX |
EndNote |
| 675 |
674 |
119 |
1,468 |
133 |
112 |
- HTML: 675
- PDF: 674
- XML: 119
- Total: 1,468
- BibTeX: 133
- EndNote: 112
Views and downloads (calculated since 01 Feb 2013)
Cumulative views and downloads
(calculated since 01 Feb 2013)
Latest update: 24 Apr 2025
