|
26 May 2008
Simultaneous large-scale reliability analysis of ultra-thin MOS gate dielectrics using an automated test system
A. Domdey, K. M. Hafkemeyer, W. H. Krautschneider, and D. Schroeder
Viewed
Total article views: 1,488 (including HTML, PDF, and XML)
| HTML |
PDF |
XML |
Total |
BibTeX |
EndNote |
| 684 |
682 |
122 |
1,488 |
135 |
119 |
- HTML: 684
- PDF: 682
- XML: 122
- Total: 1,488
- BibTeX: 135
- EndNote: 119
Views and downloads (calculated since 01 Feb 2013)
Cumulative views and downloads
(calculated since 01 Feb 2013)
Latest update: 23 Jun 2025
