|
26 May 2008
Simultaneous large-scale reliability analysis of ultra-thin MOS gate dielectrics using an automated test system
A. Domdey, K. M. Hafkemeyer, W. H. Krautschneider, and D. Schroeder
Viewed
Total article views: 1,677 (including HTML, PDF, and XML)
| HTML |
PDF |
XML |
Total |
BibTeX |
EndNote |
| 797 |
744 |
136 |
1,677 |
158 |
196 |
- HTML: 797
- PDF: 744
- XML: 136
- Total: 1,677
- BibTeX: 158
- EndNote: 196
Views and downloads (calculated since 01 Feb 2013)
Cumulative views and downloads
(calculated since 01 Feb 2013)
Latest update: 20 Mar 2026
