
|
26 May 2008
Simultaneous large-scale reliability analysis of ultra-thin MOS gate dielectrics using an automated test system
A. Domdey, K. M. Hafkemeyer, W. H. Krautschneider, and D. Schroeder
Viewed
Total article views: 1,476 (including HTML, PDF, and XML)
HTML |
PDF |
XML |
Total |
BibTeX |
EndNote |
679 |
675 |
122 |
1,476 |
135 |
116 |
- HTML: 679
- PDF: 675
- XML: 122
- Total: 1,476
- BibTeX: 135
- EndNote: 116
Views and downloads (calculated since 01 Feb 2013)
Cumulative views and downloads
(calculated since 01 Feb 2013)
Latest update: 02 Jun 2025