Articles | Volume 6
https://doi.org/10.5194/ars-6-205-2008
https://doi.org/10.5194/ars-6-205-2008
26 May 2008
 | 26 May 2008

Simultaneous large-scale reliability analysis of ultra-thin MOS gate dielectrics using an automated test system

A. Domdey, K. M. Hafkemeyer, W. H. Krautschneider, and D. Schroeder

Viewed

Total article views: 1,444 (including HTML, PDF, and XML)
HTML PDF XML Total BibTeX EndNote
659 667 118 1,444 129 110
  • HTML: 659
  • PDF: 667
  • XML: 118
  • Total: 1,444
  • BibTeX: 129
  • EndNote: 110
Views and downloads (calculated since 01 Feb 2013)
Cumulative views and downloads (calculated since 01 Feb 2013)
Latest update: 14 Dec 2024
Download