|
26 May 2008
Simultaneous large-scale reliability analysis of ultra-thin MOS gate dielectrics using an automated test system
A. Domdey, K. M. Hafkemeyer, W. H. Krautschneider, and D. Schroeder
Viewed
Total article views: 1,714 (including HTML, PDF, and XML)
| HTML |
PDF |
XML |
Total |
BibTeX |
EndNote |
| 811 |
763 |
140 |
1,714 |
161 |
201 |
- HTML: 811
- PDF: 763
- XML: 140
- Total: 1,714
- BibTeX: 161
- EndNote: 201
Views and downloads (calculated since 01 Feb 2013)
Cumulative views and downloads
(calculated since 01 Feb 2013)
Latest update: 03 May 2026
