7 citations as recorded by crossref.

1. A 2D compact model for lightly doped DG MOSFETs (P-DGFETs) including negative bias temperature instability (NBTI) and short channel effects (SCEs) O. Samy et al. 10.1016/j.microrel.2016.11.004
2. Countermeasures against NBTI degradation on 6T-SRAM cells E. Glocker et al. 10.5194/ars-9-255-2011
3. Built-In Self-Test Methodology With Statistical Analysis for Electrical Diagnosis of Wearout in a Static Random Access Memory Array W. Kim et al. 10.1109/TVLSI.2015.2513369
4. Improving Testability and Reliability of Advanced SRAM Architectures J. Kinseher et al. 10.1109/TETC.2017.2677400
5. Low Subthreshold Swing and High Performance of Ultrathin PEALD InGaZnO Thin-Film Transistors S. Jeong et al. 10.1109/TED.2021.3062321
6. Short Term Cell-Flipping Technique for Mitigating SNM Degradation Due to NBTI Y. KUNITAKE et al. 10.1587/transele.E94.C.520
7. Impact of positive bias temperature instability (PBTI) on 3T1D-DRAM cells N. Aymerich et al. 10.1016/j.vlsi.2011.11.014