10 citations as recorded by crossref.

1. Quantum ferromagnetism in transition metals doped II-VI semiconductors for spintronic applications: A merging technology A. Mera et al.
2. An efficient NBTI sensor and compensation circuit for stable and reliable SRAM cells A. Shah et al.
3. On the reliability estimation of nano-circuits using neural networks A. Beg et al.
4. In-situ transistor reliability measurements through nanoprobing O. Dixon-Luinenburg & J. Fine
5. Impact of Bias temperature instability on reconfigurable field effect transistors and circuits G. Galderisi et al.
6. An accurate MOSFET aging model for 28nm integrated circuit simulation B. Tudor et al.
7. Evaluation of Advanced MOSFET Threshold Voltage Drift Measurement Techniques B. Ullmann et al.
8. Impact of NBTI Aging on the Single-Event Upset of SRAM Cells M. Bagatin et al.
9. Bias Temperature Stress Instability of Multilayered MoS2 Field-Effect Transistors With CYTOP Passivation S. Seo & S. Jin
10. Systematic study of room-temperature ferromagnetism and the optical response of Zn1−xTMxS/Se (TM  =  Mn, Fe, Co, Ni) ferromagnets: first-principle approach Q. Mahmood et al.