Articles | Volume 7
https://doi.org/10.5194/ars-7-201-2009
https://doi.org/10.5194/ars-7-201-2009
19 May 2009
 | 19 May 2009

Device reliability challenges for modern semiconductor circuit design – a review

C. Schlünder

Viewed

Total article views: 5,327 (including HTML, PDF, and XML)
HTML PDF XML Total BibTeX EndNote
1,279 3,604 444 5,327 185 222
  • HTML: 1,279
  • PDF: 3,604
  • XML: 444
  • Total: 5,327
  • BibTeX: 185
  • EndNote: 222
Views and downloads (calculated since 01 Feb 2013)
Cumulative views and downloads (calculated since 01 Feb 2013)
Latest update: 21 Dec 2025
Download
Share