
|
29 Jul 2011
Benefits of on-wafer calibration standards fabricated in membrane technology
M. Rohland, U. Arz, and S. Büttgenbach
Viewed
Total article views: 1,500 (including HTML, PDF, and XML)
HTML |
PDF |
XML |
Total |
BibTeX |
EndNote |
720 |
663 |
117 |
1,500 |
136 |
156 |
- HTML: 720
- PDF: 663
- XML: 117
- Total: 1,500
- BibTeX: 136
- EndNote: 156
Views and downloads (calculated since 01 Feb 2013)
Cumulative views and downloads
(calculated since 01 Feb 2013)
Cited
Latest update: 09 Oct 2025