|
29 Jul 2011
Benefits of on-wafer calibration standards fabricated in membrane technology
M. Rohland, U. Arz, and S. Büttgenbach
Viewed
Total article views: 1,403 (including HTML, PDF, and XML)
HTML |
PDF |
XML |
Total |
BibTeX |
EndNote |
655 |
636 |
112 |
1,403 |
125 |
109 |
- HTML: 655
- PDF: 636
- XML: 112
- Total: 1,403
- BibTeX: 125
- EndNote: 109
Views and downloads (calculated since 01 Feb 2013)
Cumulative views and downloads
(calculated since 01 Feb 2013)
Cited
Latest update: 31 Jan 2025