Articles | Volume 9
https://doi.org/10.5194/ars-9-303-2011
https://doi.org/10.5194/ars-9-303-2011
01 Aug 2011
 | 01 Aug 2011

Coupling path influence on the conducted emission measurement results by the EMC semiconductor test board

M. Frick, R. Eidher, and R. Weigel

Viewed

Total article views: 2,858 (including HTML, PDF, and XML)
HTML PDF XML Total BibTeX EndNote
723 1,819 316 2,858 122 118
  • HTML: 723
  • PDF: 1,819
  • XML: 316
  • Total: 2,858
  • BibTeX: 122
  • EndNote: 118
Views and downloads (calculated since 01 Feb 2013)
Cumulative views and downloads (calculated since 01 Feb 2013)
Latest update: 03 Jul 2024
Download