|
01 Aug 2011
Coupling path influence on the conducted emission measurement results by the EMC semiconductor test board
M. Frick, R. Eidher, and R. Weigel
Viewed
Total article views: 3,313 (including HTML, PDF, and XML)
| HTML |
PDF |
XML |
Total |
BibTeX |
EndNote |
| 955 |
1,993 |
365 |
3,313 |
177 |
229 |
- HTML: 955
- PDF: 1,993
- XML: 365
- Total: 3,313
- BibTeX: 177
- EndNote: 229
Views and downloads (calculated since 01 Feb 2013)
Cumulative views and downloads
(calculated since 01 Feb 2013)
Latest update: 12 Jun 2026
