|
01 Aug 2011
Coupling path influence on the conducted emission measurement results by the EMC semiconductor test board
M. Frick, R. Eidher, and R. Weigel
Viewed
Total article views: 2,967 (including HTML, PDF, and XML)
| HTML |
PDF |
XML |
Total |
BibTeX |
EndNote |
| 777 |
1,866 |
324 |
2,967 |
132 |
127 |
- HTML: 777
- PDF: 1,866
- XML: 324
- Total: 2,967
- BibTeX: 132
- EndNote: 127
Views and downloads (calculated since 01 Feb 2013)
Cumulative views and downloads
(calculated since 01 Feb 2013)
Latest update: 02 Apr 2025
