|
01 Aug 2011
Coupling path influence on the conducted emission measurement results by the EMC semiconductor test board
M. Frick, R. Eidher, and R. Weigel
Viewed
Total article views: 3,331 (including HTML, PDF, and XML)
| HTML |
PDF |
XML |
Total |
BibTeX |
EndNote |
| 956 |
2,008 |
367 |
3,331 |
178 |
229 |
- HTML: 956
- PDF: 2,008
- XML: 367
- Total: 3,331
- BibTeX: 178
- EndNote: 229
Views and downloads (calculated since 01 Feb 2013)
Cumulative views and downloads
(calculated since 01 Feb 2013)
Latest update: 02 Jul 2026
