Articles | Volume 20
https://doi.org/10.5194/ars-20-1-2023
https://doi.org/10.5194/ars-20-1-2023
21 Mar 2023
 | 21 Mar 2023

Comparison of S-Parameter Measurement Methods for Adapters

Karsten Kuhlmann, Frauke Gellersen, and Meike Tschauder

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Latest update: 25 Feb 2024
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Short summary
In measurement applications many devices with two ports have different interfaces at their two ports and are commonly referred to as adapters. The interface e.g. can be a coaxial connector, a rectangular waveguide flange, or a coplanar waveguide probe tip. Two suitable methods for the measurement of such adapters are compared. The first one is a VNA measurement method using only one port calibration standards and one port measurements. It will be compared to a two port calibration method.