Articles | Volume 4
https://doi.org/10.5194/ars-4-225-2006
https://doi.org/10.5194/ars-4-225-2006
06 Sep 2006
 | 06 Sep 2006

Yield-improving test and routing circuits for a novel 3-D interconnect technology

M. Bschorr, H.-J. Pfleiderer, P. Benkart, A. Kaiser, A. Munding, E. Kohn, A. Heittmann, H. Hübner, and U. Ramacher

Viewed

Total article views: 1,867 (including HTML, PDF, and XML)
HTML PDF XML Total BibTeX EndNote
660 1,039 168 1,867 132 114
  • HTML: 660
  • PDF: 1,039
  • XML: 168
  • Total: 1,867
  • BibTeX: 132
  • EndNote: 114
Views and downloads (calculated since 01 Feb 2013)
Cumulative views and downloads (calculated since 01 Feb 2013)
Latest update: 23 Feb 2025
Download
Share