Articles | Volume 4
https://doi.org/10.5194/ars-4-225-2006
https://doi.org/10.5194/ars-4-225-2006
06 Sep 2006
 | 06 Sep 2006

Yield-improving test and routing circuits for a novel 3-D interconnect technology

M. Bschorr, H.-J. Pfleiderer, P. Benkart, A. Kaiser, A. Munding, E. Kohn, A. Heittmann, H. Hübner, and U. Ramacher

Viewed

Total article views: 2,060 (including HTML, PDF, and XML)
HTML PDF XML Total BibTeX EndNote
795 1,088 177 2,060 153 182
  • HTML: 795
  • PDF: 1,088
  • XML: 177
  • Total: 2,060
  • BibTeX: 153
  • EndNote: 182
Views and downloads (calculated since 01 Feb 2013)
Cumulative views and downloads (calculated since 01 Feb 2013)
Latest update: 18 Dec 2025
Download
Share