
|
06 Sep 2006
Yield-improving test and routing circuits for a novel 3-D interconnect technology
M. Bschorr, H.-J. Pfleiderer, P. Benkart, A. Kaiser, A. Munding, E. Kohn, A. Heittmann, H. Hübner, and U. Ramacher
Viewed
Total article views: 1,887 (including HTML, PDF, and XML)
HTML |
PDF |
XML |
Total |
BibTeX |
EndNote |
673 |
1,043 |
171 |
1,887 |
134 |
115 |
- HTML: 673
- PDF: 1,043
- XML: 171
- Total: 1,887
- BibTeX: 134
- EndNote: 115
Views and downloads (calculated since 01 Feb 2013)
Cumulative views and downloads
(calculated since 01 Feb 2013)
Latest update: 02 Apr 2025