Articles | Volume 4
https://doi.org/10.5194/ars-4-225-2006
https://doi.org/10.5194/ars-4-225-2006
06 Sep 2006
 | 06 Sep 2006

Yield-improving test and routing circuits for a novel 3-D interconnect technology

M. Bschorr, H.-J. Pfleiderer, P. Benkart, A. Kaiser, A. Munding, E. Kohn, A. Heittmann, H. Hübner, and U. Ramacher

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