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06 Sep 2006
             
         
    Yield-improving test and routing circuits for a novel 3-D interconnect technology 
        
            M. Bschorr, H.-J. Pfleiderer, P. Benkart, A. Kaiser, A. Munding, E. Kohn, A. Heittmann, H. Hübner, and U. Ramacher
        
            
            
            
            
            
            
            
            
            
    
        
            
        
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                            Total article views: 2,011 (including HTML, PDF, and XML)
                        
                            
                                
                                
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                                    175 | 
                                    2,011 | 
                                    149 | 
                                    165 | 
                        
                                
                                
                            
                            
                                - HTML: 762
 
                                - PDF: 1,074
 
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                                - Total: 2,011
 
                                - BibTeX: 149
 
                                - EndNote: 165
 
                            
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