
|
06 Sep 2006
Yield-improving test and routing circuits for a novel 3-D interconnect technology
M. Bschorr, H.-J. Pfleiderer, P. Benkart, A. Kaiser, A. Munding, E. Kohn, A. Heittmann, H. Hübner, and U. Ramacher
Viewed
Total article views: 2,078 (including HTML, PDF, and XML)
| HTML |
PDF |
XML |
Total |
BibTeX |
EndNote |
| 806 |
1,095 |
177 |
2,078 |
155 |
184 |
- HTML: 806
- PDF: 1,095
- XML: 177
- Total: 2,078
- BibTeX: 155
- EndNote: 184
Views and downloads (calculated since 01 Feb 2013)
Cumulative views and downloads
(calculated since 01 Feb 2013)
Latest update: 09 Jan 2026