Articles | Volume 4
https://doi.org/10.5194/ars-4-225-2006
https://doi.org/10.5194/ars-4-225-2006
06 Sep 2006
 | 06 Sep 2006

Yield-improving test and routing circuits for a novel 3-D interconnect technology

M. Bschorr, H.-J. Pfleiderer, P. Benkart, A. Kaiser, A. Munding, E. Kohn, A. Heittmann, H. Hübner, and U. Ramacher

Viewed

Total article views: 1,887 (including HTML, PDF, and XML)
HTML PDF XML Total BibTeX EndNote
673 1,043 171 1,887 134 115
  • HTML: 673
  • PDF: 1,043
  • XML: 171
  • Total: 1,887
  • BibTeX: 134
  • EndNote: 115
Views and downloads (calculated since 01 Feb 2013)
Cumulative views and downloads (calculated since 01 Feb 2013)
Latest update: 02 Apr 2025
Download
Share