
|
06 Sep 2006
Yield-improving test and routing circuits for a novel 3-D interconnect technology
M. Bschorr, H.-J. Pfleiderer, P. Benkart, A. Kaiser, A. Munding, E. Kohn, A. Heittmann, H. Hübner, and U. Ramacher
Viewed
Total article views: 2,278 (including HTML, PDF, and XML)
| HTML |
PDF |
XML |
Total |
BibTeX |
EndNote |
| 910 |
1,165 |
203 |
2,278 |
183 |
227 |
- HTML: 910
- PDF: 1,165
- XML: 203
- Total: 2,278
- BibTeX: 183
- EndNote: 227
Views and downloads (calculated since 01 Feb 2013)
Cumulative views and downloads
(calculated since 01 Feb 2013)
Latest update: 06 Oct 2026