Articles | Volume 6
https://doi.org/10.5194/ars-6-265-2008
https://doi.org/10.5194/ars-6-265-2008
26 May 2008
 | 26 May 2008

Physical IC debug – backside approach and nanoscale challenge

C. Boit, R. Schlangen, A. Glowacki, U. Kindereit, T. Kiyan, U. Kerst, T. Lundquist, S. Kasapi, and H. Suzuki

Viewed

Total article views: 3,353 (including HTML, PDF, and XML)
HTML PDF XML Total BibTeX EndNote
1,094 2,059 200 3,353 191 248
  • HTML: 1,094
  • PDF: 2,059
  • XML: 200
  • Total: 3,353
  • BibTeX: 191
  • EndNote: 248
Views and downloads (calculated since 01 Feb 2013)
Cumulative views and downloads (calculated since 01 Feb 2013)

Cited

Latest update: 01 Aug 2026
Download
Share