Equivalent circuit simulation of HPEM-induced transient responses at nonlinear loads
Miroslav Kotzev
Institute for Reliability of Technical Systems and Electrical Measurement, University of Siegen, Hölderlinstr. 3, 57076 Siegen, Germany
Xiaotang Bi
Institute for Reliability of Technical Systems and Electrical Measurement, University of Siegen, Hölderlinstr. 3, 57076 Siegen, Germany
Matthias Kreitlow
Bundeswehr Research Institute for Protective Technologies and NBC Protection, Humboldtstr. 100, 29663 Munster, Germany
Frank Gronwald
CORRESPONDING AUTHOR
Institute for Reliability of Technical Systems and Electrical Measurement, University of Siegen, Hölderlinstr. 3, 57076 Siegen, Germany
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Cited articles
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Short summary
In this article the modeling of electromagnetic field coupling to nonlinear devices is studied. This is of benefit in the context of Electromagnetic Compatibility where the interaction between sensitive electronics within complex systems and electromagnetic interference is investigated.
In this article the modeling of electromagnetic field coupling to nonlinear devices is studied....