Articles | Volume 22
https://doi.org/10.5194/ars-22-35-2024
https://doi.org/10.5194/ars-22-35-2024
08 Nov 2024
 | 08 Nov 2024

Uncertainties of S-Parameter Measurements in Rectangular Waveguides at PTB

Andreas Tobias Schramm, Frauke Kathinka Helene Gellersen, and Karsten Kuhlmann

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Influence of LO cable movements on VNA measurements using Frequency Extensions
Frauke Kathinka Helene Gellersen, David Ulm, Florian Rausche, Andreas Tobias Schramm, and Karsten Kuhlmann
Adv. Radio Sci., 22, 47–52, https://doi.org/10.5194/ars-22-47-2024,https://doi.org/10.5194/ars-22-47-2024, 2024
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Cited articles

Arsenovic, A.: A Method to Remove the Effects of LO Drift from Vector Network Analyzer Measurements, in: 2020 94th ARFTG Microwave Measurement Symposium (ARFTG), 1–5 pp., https://doi.org/10.1109/ARFTG47584.2020.9071755, 2020. a, b
BIPM: KCDB, Online, https://www.bipm.org/kcdb/ (last access: 12 March 2024), 2024. a
Dassault Systèmes: CST Studio Suite, Online, https://www.3ds.com/products/simulia/cst-studio-suite (last access: 19 March 2024), 2024. a
Engen, G. and Hoer, C.: Thru-Reflect-Line: An Improved Technique for Calibrating the Dual Six-Port Automatic Network Analyzer, IEEE T. Microw. Theory, 27, 987–993, https://doi.org/10.1109/TMTT.1979.1129778, 1979. a
Federal Institute of Metrology (METAS): VNA Tools for reliable RF and Microwave measurements, https://www.metas.ch/metas/en/home/fabe/hochfrequenz/vna-tools.html (last access: 28 March 2024), 2024. a, b
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Short summary
A systematic analysis of measurement uncertainties in rectangular waveguide calibrations is condcuted. Uncertainty budgets for different waveguide bands are examined, individual uncertainty contributions are discussed and the significant impact of connection repeatability is highlighted. Consequently, an investigation into misaligned waveguide interfaces is undertaken, emphasizing the importance of precise alignment, supported by simulation and experimental data.